A new imaging technique uncovers how electronic patterns in quantum materials evolve unevenly across space and temperature.

FRANKFURT. With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, the Goethe University in Frankfurt (Germany) is expanding its research ...

ZEISS has unveiled the new ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimized for demanding sample preparation. It provides a live, high-resolution “see ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

Alfredo has a PhD in Astrophysics and a Master's in Quantum Fields and Fundamental Forces from Imperial College London. Alfredo has a PhD in Astrophysics and a Master's in Quantum Fields and ...

Researchers have built an upgraded quantum microscope that can map momentum-resolved tunneling spectra in graphene at room temperature and extract signatures consistent with electron–electron ...

ORNL researcher David Cullen has been named a Fellow of the Microscopy Society of America for significant contributions to ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

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ZEISS Crossbeam 750 ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing unmatched feedback for precision endpointing in sample preparation workflows.