As designs transition from 130nm to 90nm and below, designers must consider manufacturing effects early in the design cycle. Shrinking design nodes, larger designs, and expanding design complexity ...

Process variations can transform the most innovative integrated circuit design into a failure. To account for these variations, designing for high manufacturing yield is as important as designing for ...

With nanometer processes, silicon success depends on the designer's ability to anticipate manufacturing concerns before tapeout. To achieve acceptable yield (or even working silicon), designers must ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...