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From Test Patterns to Streaming: How Baby Boomers Witnessed America Transform

Born between 1946 and 1964, baby boomers experienced a world of typewriters, traveler's checks, and duck-and-cover drills.
IEEE

A Test Response Systolic Compression Method Based on Compressed Sensing

Abstract: This article presents a novel method for compressing test responses based on scan fault response matrices. The primary goal is to minimize the amount of test response data by constructing a ...
IEEE

Transient Fault Detection and Failure Effect Analysis Based on Design for Test and Fault Tree Analysis for Automotive Chips

Abstract: Automotive-grade chips play a crucial role in the development of intelligent networked vehicles, and functional safety is a key issue of automotive-grade chips. Transient faults induced by ...

Apple's research explains how AI can identify bugs in code and generate QE tests

New papers on Apple's machine learning blog detail how AI can be used for faster, cheaper, and more effective QE testing, as ...